Authors: Haji Shirinzadeh
Affiliations: Department Semiconductors (Device Fabrication), Surface Physics and Thin Films, Material and Energy Research Center (MERC), Alvand Avenue, Postal Code: 13145-1659, Tehran, Iran
Emails: h_szadeh@merc.ac.ir
Journal: International Journal of Fundamental Physical Sciences (IJFPS)
Volume: 4, Issue: 3, Pages: 89-94, Date: September, 2014
ISSN: 2231-8186
DOI: https://doi.org/10.14331/ijfps.2014.330070
The oscillations in interlayer exchange coupling between ferromagnetic layers separated by a nonmagnetic spacer layer manifest oscillatory magnetic properties depending on the thickness of the copper interlayer. Using Molecular Beam Epitaxy, Co/Cu multilayer films were fabricated, and preliminary results on microstructure and magnetization properties are reported. The conductance between ferromagnetic layers depends on the relative magnetization orientation, optimizing the giant magnetoresistance (GMR) effect. This study addresses magnetic anisotropies, spin diffusion, RHEED monitoring, and spin-dependent scattering at interfaces in GMR multilayers.
Thin films, Multilayers, Interlayer, Exchange Coupling, Sputtered